PROJECT TITLE :

Emission Source Microscopy Technique for EMI Source Localization

ABSTRACT:

For giant, advanced systems with multiple sources at the identical frequency, localizing the sources of radiation usually proves troublesome. This paper presents an emission source microscopy (ESM) technique derived from artificial aperture radar (SAR) to localize radiating sources on a PCB. Close to-field scanning provides restricted data about the parts contributing to way-field radiation. This paper presents the source localization methodology, supported by simulation and measurement results. After localizing the sources, the so much-field contribution and the whole radiated power from every individual supply can be estimated. The results show that the proposed method will distinguish between multiple radiating sources on a complicated PCB.