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  3. Microelectronics and Nanometer Structures
  4. Growth of GaSb1-xBix by molecular beam epitaxy
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Category: Microelectronics and Nanometer Structures
By MTech Projects
MTech Projects
31.Jan
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Growth of GaSb1-xBix by molecular beam epitaxy

ABSTRACT:

Molecular beam epitaxy for GaSb1-xBix is investigated in this article. The growth window for incorporation of Bi in GaSb was found. Strategies of avoiding formation of Bi droplets and enhancing Bi incorporation were studied. The Bi incorporation was confirmed by SIMS and RBS measurements. The Bi concentration in the samples was found to increase with increasing growth temperature and Bi flux. The position of GaSb1-xBix layer peak in XRD rocking curves is found to be correlated to Bi composition. Surface and structural properties of the samples were also investigated. Samples grown on GaSb and GaAs substrates were compared and no apparent difference for Bi incorporation was found.

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Previous article: Electrical properties of C60 and Si codoped GaAs layers Electrical properties of C60 and Si codoped GaAs layers Next article: Homoepitaxial N-polar GaN layers and HEMT structures grown by rf-plasma assisted molecular beam epitaxy Homoepitaxial N-polar GaN layers and HEMT structures grown by rf-plasma assisted molecular beam epitaxy
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